[1]
“Основы метрологии и стандартизации в электронике и микроэлектронике”, MJST, vol. 4, no. 5, pp. 147–150, May 2024, Accessed: May 19, 2026. [Online]. Available: https://www.mjstjournal.universalpublishings.com/index.php/mjst/article/view/1357