[1]
“SATURATION THICKNESSES FOR SCATTERING BREMSSTRAHLUNG OF ELECTRONS WITH Ee = 13 AND 22 MeV FROM FLAT LEAD TARGETS AND THEIR STATISTICAL PROCESSING OF THE DATA DEPENDENCE”, MJST, vol. 6, no. 5, pp. 143–151, May 2026, Accessed: May 19, 2026. [Online]. Available: https://www.mjstjournal.universalpublishings.com/index.php/mjst/article/view/7355